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X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks and pigments (for... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, x200 magnification for spots on...
