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Infrared Reflectography Images of the Writing on the Bottom Edge of Slg. Uns...
Infrared reflectography (IRR) images were captured with an Apollo reflectography camera (Opus Instruments, UK) from the Chinese medical manuscript "Slg. Unschuld... -
X-Ray Fluorescence and Reflectography Data from Vatican, Vatican Library Ms R...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library... -
X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzbu...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel... -
Priests, Officials, and Scribes: "Ink-Contacts" in the Multilingual and Multi...
Presentation at the international colloquium INK-QUIRY Inks: between text and materiality, 11.12.2023, University Complutense of Madrid, Madrid (Spain). The research for this... -
Mixed Inks in Two Coptic Documents from the Hermopolite Region Relating to Le...
In this article, we present two Coptic papyri, P 11934 and P 11935 from the Berlin collection excavated in Ashmunein (ancient Hermopolis) by Otto Rubensohn in 1906. We employ a... -
X-Ray Fluorescence and Reflectography Data from Vatican, Vatican Library Ms V...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library... -
Ink-sights into Hellenistic and Roman Egypt: a journey from Carbon to Iron-ga...
Presentation at the 4th International Congress of Archaeological Sciences in the Eastern Mediterranean and the Middle East, Nicosia (Cyprus), 05/2024. Recent research on the... -
X-Ray Fluorescence and Reflectography Data from Vatican, Vatican Library Ms R...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library... -
X-Ray Fluorescence and Reflectography Data from Leipzig, Universitaetsbibliot...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from... -
INSTRUMENTAL ANALYSIS OF THE INKS FROM THE MAGICAL PAPYRUS P. BEROL. INV. 502...
In the last two decades, the Bundesanstalt für Materialforschug und -prüfung (BAM), together with the Centre for the Study of Manuscript Cultures (CSMC, University of... -
X-Ray Fluorescence and Reflectography Data from Vatican, Vatican Library Ms V...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Vatican Library... -
X-Ray Fluorescence and Reflectography Data from Hamburg, Staats- und Universi...
XRF (Bruker M6 JetStream: 50kV, 600 µA, maps with 70 to 200 µm steps and 40-50 ms per pixel) and reflectography (DinoLite AD4113T-I2V: x40 magnification, vis,... -
X-Ray Fluorescence and Reflectography Data from Munich, Bayerisches Hauptstaa...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran... -
X-Ray Fluorescence and Reflectography Data from Hamburg, Staats- und Universi...
XRF (Bruker M6 JetStream: 50kV, 600 µA, maps with 200 µm steps and 25-30 ms per pixel) and reflectography (DinoLite AD4113T-I2V: x40 magnification, vis, NIR... -
Standardised System for the Labelling of Analytical Data
This document shows a standardised system for the uniform file labelling of analytical data (spectroscopic measurements and spectral images) captured with instruments from the... -
X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Reflectography Data from Dublin, Chester Beatty Librar...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks and pigments (for... -
X-ray Fluorescence and reflectography data of Ethiopian manuscript CHJN003
XRF (Artax: 50kV, 600 µA, linescans of 10 points of 50s each each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV... -
X-Ray Fluorescence and Reflectography Data from Forschungsbibliothek Gotha Ms...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis... -
X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis...
