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Soft errors caused by muons and neutrons at 20 nm technology node
Soft errors are expected to be the most dominant failure mechanism at 20 nm technology node. With the low critical charge requirements for an upset (~ 0.1 fC), SRAM cells and... -
Neutron reflection from 3He layer adsorbed on liquid 4He surface
More than four decades ago A. F. Andreev predicted theoretically the existence of quantum states of 3He atoms on free surface of liquid 4He . In other words, at low...
