Interface effects, including proximity induced magnetisation (PIM), play an import role in many spintronic devices employing heavy metal/ferromagnetic/heavy metal structures. The choice of elements is important, however, layer ordering is often a secondary priority. Polarised neutron reflectometry will be used to characterise the magnetic depth profile of Pt/CoFeTaB/Ir films along with its structural inverse, Ir/CoFeTaB/Pt, to better understand requirements for PIM and to explain the significant magnetic differences observed between such inverted samples, leading to improved layer order optimisation for future spintronic devices.