Insoluble layer formation in polymer bilayers

DOI

In a previous neutron reflectivity(NR) measurement (RB620370) on CRISP, we showed that the insoluble interlayer formed between the charge injection layer and a semiconducting polymer layer during annealing is an alloy of the the semiconducting polymer and the main component of the charge injection layer, polystyrene-sulfonate(PSS) polymers. We wish to explore further into this area, investigating whether there will be the same interfacial changes occur between simpler polymers such as PMMA or poly(styrene) and PSS? Preliminary lab measurements indicate that this is the case. We wish to use the unique combination of spatial resolution and isotopic sensitivity offered by NR to study PMMA-PS bilayers before, during and after annealing to obtain a fuller understanding of this process.

Identifier
DOI https://doi.org/10.5286/ISIS.E.24079764
Metadata Access https://icatisis.esc.rl.ac.uk/oaipmh/request?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:icatisis.esc.rl.ac.uk:inv/24079764
Provenance
Creator Dr Simon Martin; Mr Wei Yin
Publisher ISIS Neutron and Muon Source
Publication Year 2013
Rights CC-BY Attribution 4.0 International; https://creativecommons.org/licenses/by/4.0/
OpenAccess true
Contact isisdata(at)stfc.ac.uk
Representation
Resource Type Dataset
Discipline Photon- and Neutron Geosciences
Temporal Coverage Begin 2010-05-10T08:09:47Z
Temporal Coverage End 2010-05-12T14:16:02Z