We intent to characterize the Single Event Effects produced by muons in state-of-the-art systems. We will focus on FPGAs, measuring the induced error rate on both the SRAM configuration memory and on different implemented circuits. We will also test complex parallels systems as Graphic Processing Units in order to evaluate the occurrence of muons-induced errors in the internal resources and the effects on the output of typical applications. The devices we are going to test with muons have been widely characterized with neutrons. We will then be able compare the error rate and the effects at the output caused by muons with the neutrons one.