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Replication Data for: A Complementary Experimental and Theoretical Approach f...
This dataset contains raw and processed data corresponding to all the atomic force microscopy (AFM), scanning electron microscopy (SEM), polarization-modulation infrared... -
HIM and AFM Data set from first AFM in the HIM test
In this work, the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM) is reported for the first time. The helium ion microscope is a powerful...
