-
X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzbu...
XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel... -
X-Ray Fluorescence and Reflectography Data from Munich, Bayerisches Hauptstaa...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 37 Emmeran... -
X-Ray Fluorescence and Reflectography Data from Munich, Staatsarchiv München ...
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Staatsarchiv...