X-Ray Fluorescence and Reflectography Data from Munich, Staatsarchiv München charters Regensburger Niedermunster2, Regensburger Niedermunster 3, and Hochstift Freising 8.

DOI

XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and  reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from Staatsarchiv München charters Regensburger Niedermunster2, Regensburger Niedermunster 3, and Hochstift Freising 8.

protocol and results Regensburger Niedermunster and Hoschstift Freising Charters.pptx - protocol and full results
Regensburger Niedermunster and Hoschstift Freising Charters_reflectography.zip - complete reflectography Dataset
Regensburger Niedermunster and Hoschstift Freising Charters_XRF.zip - complete XRF Dataset
Report_Regensburger Niedermunster and Hoschstift Freising Charters.docx - detailed report

The research for this analysis was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under Germany's Excellence Strategy – EXC 2176 'Understanding Written Artefacts: Material, Interaction and Transmission in Manuscript Cultures', project no. 390893796. The research was conducted within the scope of the Centre for the Study of Manuscript Cultures (CSMC) at Universität Hamburg.

Identifier
DOI https://doi.org/10.25592/uhhfdm.11171
Related Identifier https://doi.org/10.25592/uhhfdm.11170
Metadata Access https://www.fdr.uni-hamburg.de/oai2d?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:fdr.uni-hamburg.de:11171
Provenance
Creator Bonnerot, Olivier ORCID logo
Publisher Universität Hamburg
Contributor Bonnerot, Olivier; Roach, Levi
Publication Year 2022
Rights Restricted Access; info:eu-repo/semantics/restrictedAccess
OpenAccess false
Contact Bonnerot, Olivier (Centre for the Study of Manuscript Cultures (CSMC))
Representation
Language English
Resource Type Dataset
Discipline Other