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Observation of the magnetisation profile in a ferromagnetic semiconductor/fer...
Ferromagnetic III-V semiconductors lie at the confluence of magnetic storage and optoelectronic technologies, allowing the development of semiconductor heterostructure devices... -
Continuous contrast variation in magnetic reference layer measurements
We propose a feasibility study for continuous contrast variation in soft-condensed matter reflectometry experiments using the technique of magnetic reference layers. Changing... -
z-plus test on Ho2Ti2O7
This dataset has no description
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Non-planar exchange bias in a hard magnetic FePt/FePt3 epitaxial bilayer
We plan to perform polarized neutron reflectometry (PNR) on an epitaxial FePt(10nm)/FePt3(60nm) bilayer grown on a MgO(110) substrate. One particularity of this exchange bias...
