The goal of this proposal is to measure and characterize the Single Event Effects (SEEs) produced by neutrons available at ISIS in different commercial and state-of-the-art advanced systems. In particular, we will focus on novel SRAM- and Flash-based FPGAs, measuring the induced error rate on both the configuration memory (in the case of SRAM-based devices) and on different implemented circuits. The reduction of feature size in memories and logic gates is significantly exacerbating the soft error issue. In fact, neutrons may generate different kind of errors in devices built with modern technologies, including Soft Error Transients (SETs). Finally, we will also test complex parallels systems as Graphic Processing Units in order to evaluate the occurrence of netron-induced errors in the internal resources and the effects on the output of typical applications.