This proposal aims to determine the easy axis and Neel temperature of the new epitaxial antiferromagnetic (AFM) thin film CuMnAs. The samples have been fully structurally characterised using TEM and XRD measurements. Preliminary measurements on the WISH instrument enabled us to validate the technique for AFM thin films, and to show that CuMnAs is antiferromagnetic with magnetic ordering completed within one structural unit cell. We are proposing a detailed set of measurements, after discussion with the WISH scientists, which will enable us to unambiguously determine both the easy axis and Neel temperature of CuMnAs.