Electrical characterization of multi-gated WSe2/MoS2 van der Waals heterojunctions

DOI

Transistor measurements

Identifier
DOI https://doi.org/10.14278/rodare.2813
Related Identifier Cites https://doi.org/10.17815/jlsrf-3-159
Related Identifier IsIdenticalTo https://www.hzdr.de/publications/Publ-38985
Related Identifier IsReferencedBy https://www.hzdr.de/publications/Publ-38872
Related Identifier IsPartOf https://doi.org/10.14278/rodare.2812
Related Identifier IsPartOf https://rodare.hzdr.de/communities/fwi
Related Identifier IsPartOf https://rodare.hzdr.de/communities/ibc
Related Identifier IsPartOf https://rodare.hzdr.de/communities/rodare
Metadata Access https://rodare.hzdr.de/oai2d?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:rodare.hzdr.de:2813
Provenance
Creator Chava, Phanish ORCID logo; Kateel, Vaishnavi; Watanabe, Kenji ORCID logo; Tanihushi, Takashi ORCID logo; Helm, Manfred; Mikolajick, Thomas ORCID logo; Erbe, Artur ORCID logo
Publisher Rodare
Publication Year 2024
Rights Restricted Access; info:eu-repo/semantics/restrictedAccess
OpenAccess false
Contact https://rodare.hzdr.de/support
Representation
Language English
Resource Type Dataset
Discipline Life Sciences; Natural Sciences; Engineering Sciences