X-Ray Fluorescence and Reflectography Data from Paris, Bibliothèque Nationale de France, Ms LAT10757 and Ms NAL763

DOI

XRF (Elio: 40kV, 20 µA, spot measurements of 60s each), and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from BNF Ms LAT10757(10th century CE) and Ms NAL763 (9th century CE) from the Bibliothèque nationale de France (France).

Analysis of 14 folios (32 spots on ink + 14 spots on parchment) from Ms LAT10757; 29 folios (92 spots on ink + 29 spots on paper) from Ms NAL763

LAT10757.pptx - protocol and results for BNF Ms LAT10757
LAT10757.xlsx - complete XRF results for BNF Ms LAT10757
NAL763.pptx - protocol and results for BNF Ms NAL763
NAL763.xlsx - complete XRF results for BNF Ms NAL763
Reflectography_LAT10757.zip - complete reflectography Dataset for BNF Ms LAT10757
Reflectography_NAL763.zip - complete reflectography Dataset for BNF Ms NAL763
XRF_LAT10757.zip - complete XRF Dataset for BNF Ms LAT10757
XRF_NAL763.zip - complete XRF Dataset for BNF Ms NAL763

The research for project C08 was funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) within the Sonderforschungsbereich 950 (SFB 950). The research was conducted within the scope of the Centre for the Study of Manuscript Cultures (CSMC) at Universität Hamburg in collaboration with the Bundesanstalt für Materialforschung und -prüfung (BAM).

Identifier
DOI https://doi.org/10.25592/uhhfdm.1585
Related Identifier https://doi.org/10.25592/uhhfdm.1584
Metadata Access https://www.fdr.uni-hamburg.de/oai2d?verb=GetRecord&metadataPrefix=oai_datacite&identifier=oai:fdr.uni-hamburg.de:1585
Provenance
Creator Bonnerot, Olivier ORCID logo; Shevchuk, Ivan ORCID logo; Rabin, Ira ORCID logo
Publisher Universität Hamburg
Contributor Bonnerot, Olivier; Shevchuk, Ivan; Rabin, Ira; Hennings, Till; Depreux, Philippe
Publication Year 2020
Rights Restricted Access; info:eu-repo/semantics/restrictedAccess
OpenAccess false
Contact Bonnerot, Olivier (Centre for the Study of Manuscript Cultures (CSMC), Bundesanstalt für Materialforschung und -prüfung (BAM))
Representation
Language English
Resource Type Dataset
Discipline Other